发明名称 METHOD FOR ERASING DATA OF FLASH MEMORY DEVICE HAVING CHARGE TRAP LAYER
摘要 PURPOSE: A data erasure method of a charge trap type flash memory device is provided to improve erasure speed by injecting a plurality of carriers into a well region by applying proper bias between well regions. CONSTITUTION: A first bias is applied between a semiconductor substrate and a second well region so that the carriers of the semiconductor substrate is inserted to the second well region(110). A second bias is applied between the semiconductor substrate and the second well region so that carriers inserted to the second well region(120) is accelerated to the first well region side. A specified voltage is applied between a control gate of the memory cell and the semiconductor substrate(100).
申请公布号 KR20100034617(A) 申请公布日期 2010.04.01
申请号 KR20080093845 申请日期 2008.09.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOO, HYUN SEUNG;LEE, MYUNG SHIK
分类号 G11C16/14;G11C16/16;G11C16/34 主分类号 G11C16/14
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