发明名称 |
METHOD FOR ERASING DATA OF FLASH MEMORY DEVICE HAVING CHARGE TRAP LAYER |
摘要 |
PURPOSE: A data erasure method of a charge trap type flash memory device is provided to improve erasure speed by injecting a plurality of carriers into a well region by applying proper bias between well regions. CONSTITUTION: A first bias is applied between a semiconductor substrate and a second well region so that the carriers of the semiconductor substrate is inserted to the second well region(110). A second bias is applied between the semiconductor substrate and the second well region so that carriers inserted to the second well region(120) is accelerated to the first well region side. A specified voltage is applied between a control gate of the memory cell and the semiconductor substrate(100). |
申请公布号 |
KR20100034617(A) |
申请公布日期 |
2010.04.01 |
申请号 |
KR20080093845 |
申请日期 |
2008.09.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
YOO, HYUN SEUNG;LEE, MYUNG SHIK |
分类号 |
G11C16/14;G11C16/16;G11C16/34 |
主分类号 |
G11C16/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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