发明名称 DEFECT DETECTION IN OBJECTS USING STATISTICAL APPROACHES
摘要 Disclosed are systems, methods and articles, including an inspection system that includes at least one generator to apply energy to an object at an application point to cause waves to travel, at least partly, through the object. The system further includes at least one detector configured to detect at least a portion of the waves traveling through the object, and a statistical analyzer to perform a statistical analysis based on an output produced by the at least one detector in response to the detected portion of the waves, the statistical analysis being used to determine whether at least one defect is present in the object.
申请公布号 WO2010036934(A2) 申请公布日期 2010.04.01
申请号 WO2009US58442 申请日期 2009.09.25
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA;SCALEA, FRANCESCO, LANZA DI;COCCIA, STEFANO;BARTOLI, IVAN;SALAMONE, SALVATORE;RIZZO, PIERVINCENZO 发明人 SCALEA, FRANCESCO, LANZA DI;COCCIA, STEFANO;BARTOLI, IVAN;SALAMONE, SALVATORE;RIZZO, PIERVINCENZO
分类号 G01N29/04;G01N29/14;G01N29/44 主分类号 G01N29/04
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