发明名称 |
PROBE OF ELECTRICAL MEASURING INSTRUMENT |
摘要 |
PURPOSE: A probe of an electrical measuring instrument is provided to improve the accuracy of electrical characteristic information by improving the target accessibility to a probe. CONSTITUTION: Probes(102,104) comprise handles(102b,104b) and one or more loop antennas(102a,104a). The loop antenna is combined in the handle. The probe detects the electrical characteristic around an object. The longitudinal direction of the handle is the normal direction of the side of the loop antenna.
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申请公布号 |
KR20100034449(A) |
申请公布日期 |
2010.04.01 |
申请号 |
KR20080093593 |
申请日期 |
2008.09.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LIM, JAE DEOK;SEOL, BYONG SU;LEE, JONG SUNG |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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