发明名称 NONVOLATILE MEMORY DEVICE AND MANUFACTURING PROCESS THEREOF
摘要 A nonvolatile memory device has a first insulating layer, a variable resistance layer provided on the first insulating layer and having a variable resistance material, and a first electrode and second electrode electrically connected with the variable resistance layer. The variable resistance layer has a variable resistance region as a data storing region and a thickness-changing region continuously extending from the variable resistance region and gradually becoming thicker from the variable resistance region.
申请公布号 US2010078616(A1) 申请公布日期 2010.04.01
申请号 US20090569489 申请日期 2009.09.29
申请人 ELPIDA MEMORY, INC. 发明人 SEKO AKIYOSHI;SATO NATSUKI;ASANO ISAMU
分类号 H01L47/00;H01L21/20 主分类号 H01L47/00
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