发明名称 |
DATA PROCESSING DEVICE AND METHODS THEREOF |
摘要 |
A data processing device includes a first memory for use during normal operation of the device and a second memory for use during testing. The second memory stores a set of test patterns for testing of a functional module. When the data processing device is in a normal (i.e. non-test) mode of operation, data is retrieved from a first memory based on a received memory address. The retrieved data is applied to the functional module of the data processing device to perform a designated function. When the data processing device is in a test mode of operation, received memory addresses are provided to the second memory for retrieval of a test pattern associated with the address. The test pattern is applied to the functional module to generate an output pattern. The result of a test is determined by comparing the output pattern to an expected pattern.
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申请公布号 |
US2010079162(A1) |
申请公布日期 |
2010.04.01 |
申请号 |
US20080253335 |
申请日期 |
2008.10.17 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
SRINATH SRINIVASAN;KUDVA SUDHIR S.;IRBY JOEL T. |
分类号 |
G01R31/3187 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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