发明名称 High-voltage metal oxide semiconductor device and fabrication method thereof
摘要 A high-voltage metal oxide semiconductor device comprising a main body of a first conductivity type, a conductive structure, a first well of a second conductivity type, a source region of the first conductivity type, and a second well of the second conductivity type is provided. The conductive structure has a first portion and a second portion. The first portion is extended from an upper surface of the main body into the main body. The second portion is extended along the upper surface of the main body. The first well is located in the main body and below the second portion. The first well is kept away from the first portion with a predetermined distance. The source region is located in the first well. The second well is located in the main body and extends from a bottom of the first portion to a place close to a drain region.
申请公布号 US2010078737(A1) 申请公布日期 2010.04.01
申请号 US20080285179 申请日期 2008.09.30
申请人 TU KAO-WAY 发明人 TU KAO-WAY
分类号 H01L29/76;H01L21/336 主分类号 H01L29/76
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