发明名称 JITTER MEASUREMENT APPARATUS, JITTER CALCULATOR, JITTER MEASUREMENT METHOD, PROGRAM, RECORDING MEDIUM, COMMUNICATION SYSTEM AND TEST APPARATUS
摘要 Provided is a jitter measurement apparatus that measures timing jitter of a signal under measurement having a prescribed repeating pattern, comprising a sampling section that coherently samples the signal under measurement within a prescribed measurement duration; a waveform reconfiguring section that rearranges ordinal ranks of data values sampled by the sampling section to generate a reconfigured waveform that is a reproduction of a waveform of the signal under measurement; an analytic signal generating section that converts the reconfigured waveform into a complex analytic signal; and a jitter measuring section that measures jitter of the signal under measurement based on the analytic signal.
申请公布号 US2010080274(A1) 申请公布日期 2010.04.01
申请号 US20090414618 申请日期 2009.03.30
申请人 ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO
分类号 H04B17/00 主分类号 H04B17/00
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