| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical phase modulation evaluation device capable of correctly evaluating the phase modulation status of an optical phase modulated signal in DPSK or DQPSK of different symbol rates. <P>SOLUTION: The optical phase modulation evaluation device comprises a bit delay interferometer 10 of a Michelson type and a light waveform test section 11. The bit delay interferometer 10 comprises a corner mirror 2a and a corner mirror 3 as a beam splitter 1 and a bit delay unit 2, and converts an optical phase modulated signal into a light intensity conversion signal. The light waveform test section 11 observes the waveform of the light intensity conversion signal outputted from the bit delay interferometer 10. The bit delay unit 2 can correspond to each of a plurality of symbol rates of the optical phase modulated signal to establish a delay amount associated with one-bit of each symbol rate. In addition, the device comprises a delay amount setting means 12 for receiving a symbol rate specifying signal for specifying the symbol rate of the optical phase modulated signal and establishing the delay amount of the bit delay unit 2, based on the symbol rate specifying signal. <P>COPYRIGHT: (C)2008,JPO&INPIT |
