发明名称 |
Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe |
摘要 |
The invention relates to a probe for electrical measurements and use of a flexible probe to produce an inflexible probe. Conventional probes comprise a substrate which is mechanically rigid. As a result only planar surfaces may be examined with the probe. According to the invention, a probe is flexibly embodied by means of a flexible substrate such that the probe may be adjusted to match various curvature radii of test bodies.
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申请公布号 |
US7688067(B2) |
申请公布日期 |
2010.03.30 |
申请号 |
US20040501724 |
申请日期 |
2004.07.15 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
BAER LUDWIG;HEINRICH WERNER |
分类号 |
G01R1/067;G01R27/26;G01N27/72;G01N27/90;G01R1/073 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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