发明名称 Positive resist composition and pattern formation method using the positive resist composition
摘要 A positive resist composition comprises: (A) a resin that contains a repeating unit (A1) having a lactone structure and a cyano group, and increases its solubility to an alkali developer by action of an acid; (B) a compound that generates an acid by irradiation with actinic ray or radiation; and (C) a solvent.
申请公布号 US7687219(B2) 申请公布日期 2010.03.30
申请号 US20060594085 申请日期 2006.11.08
申请人 FUJIFILM CORPORATION 发明人 IWATO KAORU;KODAMA KUNIHIKO
分类号 G03F7/039;G03F7/20;G03F7/30 主分类号 G03F7/039
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