发明名称 Method for producing a semiconductor integrated circuit including a thin film transistor and a capacitor
摘要 The formation of contact holes and a capacitor is performed in a semiconductor integrated circuit such as an active matrix circuit. An interlayer insulator having a multilayer (a lower layer is silicon oxide; an upper layer is silicon nitride) each having different dry etching characteristic is formed. Using a first mask, the silicon nitride corresponding to the upper layer in the interlayer insulator is etched by dry etching. This etching is completed by using the silicon oxide corresponding to the lower layer as an etching stopper. A pattern is formed using a second mask to form selectively the silicon oxide corresponding to the lower layer. Thus a first portion that the silicon oxide and the silicon nitride are etched and a second portion that only silicon nitride is etched are obtained. The first portion is used as a contact hole. A capacitor is formed in the second portion.
申请公布号 US7687809(B2) 申请公布日期 2010.03.30
申请号 US20080149485 申请日期 2008.05.02
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD 发明人 ZHANG HONGYONG
分类号 H01L23/522;H01L29/417;G02F1/1362;H01L21/28;H01L21/336;H01L21/768;H01L21/77;H01L21/84;H01L27/12;H01L27/13;H01L29/786 主分类号 H01L23/522
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