发明名称 Method and apparatus for forming an integrated circuit electrode having a reduced contact area
摘要 A method and an apparatus for manufacturing a memory cell having a non-volatile resistive memory element with a limited size active area. The method comprises a first step of providing a dielectric volume and forming a plug opening within the dielectric volume. A recessed plug of a conductive material is then formed within a lower portion of the opening and a dielectric spacer is formed along the sidewalls of an upper portion of the opening. The spacer is cylindrical and has a central hole. A contact plug is subsequently formed within the central hole, the contact plug electrically coupled to the recessed plug. The contact plug can include a memory element or an additional memory element can be applied over the contact plug.
申请公布号 US7687796(B2) 申请公布日期 2010.03.30
申请号 US20070901621 申请日期 2007.09.18
申请人 MICRON TECHNOLOGY, INC. 发明人 HARSHFIELD STEVEN T.
分类号 H01L47/00;H01L21/311;H01L21/768;H01L23/522;H01L27/24;H01L45/00 主分类号 H01L47/00
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