发明名称 Multi-beam deflector array device for maskless particle-beam processing
摘要 The invention relates to a multi-beam deflector array device for use in a particle-beam exposure apparatus employing a beam of charged particles, the multi-beam deflector array device having a plate-like shape with a membrane region, the membrane region including a first side facing towards the incoming beam of particles, an array of apertures, each aperture allowing passage of a corresponding beamlet formed out of the beam of particles, a plurality of depressions, each depression being associated with at least one aperture, and an array of electrodes, each aperture being associated with at least one electrode and each electrode being located in a depression, the electrodes being configured to realize a non-deflecting state, wherein the particles that pass through the apertures are allowed to travel along a desired path, and a deflecting state, wherein the particles are deflected off the desired path.
申请公布号 US7687783(B2) 申请公布日期 2010.03.30
申请号 US20080038326 申请日期 2008.02.27
申请人 IMS NANOFABRICATION AG;INSTITUT FUR MIKROELEKTRONIK 发明人 PLATZGUMMER ELMAR;LOESCHNER HANS;KVASNICA SAMUEL;SPRINGER REINHARD;IRMSCHER MATHIAS;LETZKUS FLORIAN;BUTSCHKE JOERG
分类号 H01J3/14 主分类号 H01J3/14
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