发明名称 Transistor with differently doped strained current electrode region
摘要 A transistor is formed by providing a semiconductor layer and forming a control electrode overlying the semiconductor layer. A portion of the semiconductor layer is removed lateral to the control electrode to form a first recess and a second recess on opposing sides of the control electrode. A first stressor is formed within the first recess and has a first doping profile. A second stressor is formed within the second recess and has the first doping profile. A third stressor is formed overlying the first stressor. The third stressor has a second doping profile that has a higher electrode current doping concentration than the first profile. A fourth stressor overlying the second stressor is formed and has the second doping profile. A first current electrode and a second current electrode of the transistor include at least a portion of the third stressor and the fourth stressor, respectively.
申请公布号 US7687337(B2) 申请公布日期 2010.03.30
申请号 US20070779318 申请日期 2007.07.18
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ZHANG DA;FOISY MARK C.
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址