发明名称 Assessment and optimization for metrology instrument
摘要 Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation.
申请公布号 US7688456(B2) 申请公布日期 2010.03.30
申请号 US20080021356 申请日期 2008.01.29
申请人 发明人 ARCHIE CHARLES N.;BANKE, JR. G. WILLIAM
分类号 G01B11/14 主分类号 G01B11/14
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