CIRCUIT AND METHOD FOR TEST CONTROLLING IN SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: A test control circuit of a semiconductor memory device and method thereof are provided to reduce an economic burden according to new equipment preparation by utilizing existing test equipment. CONSTITUTION: A pad(110) receives a normal data and a test data. A multiplexer(140) selects one data among data inputted through the pad. A data bus inversion unit(150) inverts the selection output signal of the multiplexer. The data bus inversion unit records the inverted signal to a memory cell. Even bit line data of the test data are inverted during a write operation test procedure. The multiplexer comprises a first switch, a second switch selecting the output path of test data and an inverter which inverts the output signal of the first and the second switch.