| 发明名称 |
COMPARATOR TESTING IN A FLASH A/D CONVERTER |
| 摘要 |
<p>The present disclosure relates to a testing circuit and a testing method of the comparators incorporated in a flash A/D converter. The testing circuit uses reconfigurable A/D converters to easily test and identify the defective comparators.</p> |
| 申请公布号 |
WO2010032209(A1) |
申请公布日期 |
2010.03.25 |
| 申请号 |
WO2009IB54084 |
申请日期 |
2009.09.18 |
| 申请人 |
NXP B.V.;ONETE, CRISTIAN NICOLAE |
发明人 |
ONETE, CRISTIAN NICOLAE |
| 分类号 |
H03M1/10;G01R31/28 |
主分类号 |
H03M1/10 |
| 代理机构 |
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