发明名称 |
SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor package and a manufacturing method thereof, which can reduce a stress generated in a joining part joining a semiconductor device to a wiring substrate to prevent the joining part from cracking when the semiconductor package is heated. <P>SOLUTION: A semiconductor package 10 has a semiconductor device 20 mounted on a wiring substrate 30. The semiconductor device 20 includes a semiconductor chip 21, a through hole 23 passing through from one surface of the semiconductor chip 21 to the other surface, a through electrode 26 having one end fixed to the one surface of the semiconductor chip 21 and having the other end inserted to the through hole 23 without contacting a wall surface of the through hole 23 and protruded from the other surface of the semiconductor chip 21, and a connection terminal 27 formed on the other end of the through electrode 26. The connection terminal 27 is electrically connected to the wiring substrate 30. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010067938(A) |
申请公布日期 |
2010.03.25 |
申请号 |
JP20080328258 |
申请日期 |
2008.12.24 |
申请人 |
SHINKO ELECTRIC IND CO LTD |
发明人 |
TAGUCHI YUICHI;HIGASHI MITSUTOSHI;SHIRAISHI AKINORI;SAKAGUCHI HIDEAKI;HARUHARA MASAHIRO |
分类号 |
H01L23/12;H01L21/3205;H01L23/32;H01L23/52 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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