发明名称 |
MICROARRAY MEASURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for measuring a microarray substrate with positional variations of a simple substrate of a spot. Ž<P>SOLUTION: The method for measuring a microarray substrate is composed of steps: adding a first substrate chemically reacting with a first reagent previously fixed to a spot to emit light; photographing the light of the spot to create a primary photometry image; creating a primary photometry image with the spot position specified from the primary photometry image; adding a specimen and a second reagent onto the microarray substrate after removing the first substance to bond to and react with each other and then removing the specimen not bonded to an antibody previously fixed to the spot and the second agent; adding a second substrate chemically reacting with the second reagent to emit light; photographing the light of the spot to create a secondary photometry image; and specifying the spot position in the secondary photometry image using the primary photometry analysis image and measuring the amount of luminescence of the spot. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
申请公布号 |
JP2010066146(A) |
申请公布日期 |
2010.03.25 |
申请号 |
JP20080233211 |
申请日期 |
2008.09.11 |
申请人 |
PANASONIC CORP |
发明人 |
SOGABE SEIJI;JOKO SHIGEKI |
分类号 |
G01N33/543;C12Q1/68;G01N21/64;G01N21/76;G01N21/78;G01N37/00 |
主分类号 |
G01N33/543 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|