发明名称 Semiconductor Device and Method of Forming the Same
摘要 A method of forming a semiconductor device includes forming a trench on a semiconductor substrate to define an active region, forming a radical oxide layer on a sidewall and a bottom surface of the trench, and forming a nitride layer on the radical oxide layer. The conduction band offset of the radical oxide layer is greater than the conduction band offset of a thermal oxide layer having the same thickness as the radical oxide layer.
申请公布号 US2010075479(A1) 申请公布日期 2010.03.25
申请号 US20090551311 申请日期 2009.08.31
申请人 KIM DONGCHAN;BAEK SUNGKWEON 发明人 KIM DONGCHAN;BAEK SUNGKWEON
分类号 H01L21/762;H01L21/20;H01L21/28 主分类号 H01L21/762
代理机构 代理人
主权项
地址
您可能感兴趣的专利