| 摘要 |
PROBLEM TO BE SOLVED: To solve such a problem that, in a conventional inspection method, it is necessary to execute measurement for each semiconductor laser and for each optical output by each semiconductor laser, thereby requiring an extremely long period of time, and also, it is necessary to provide a special element for simultaneously outputting a plurality of wavelengths and dividing them, thereby increasing the number of components to be used. SOLUTION: A semiconductor laser inspection device is provided with a shared optical detection element at its tip and inspects optical characteristics (optical output, an FFP, a polarization ratio or the like) of each semiconductor laser that outputs a plurality of laser light beams. The semiconductor laser inspection device has: each independent power-supply means that supplies an independent designated-pulse driving currents in time-division to a plurality of semiconductor lasers being targets and corresponds to each semiconductor laser; each synchronous-pulse-signal supply part that corresponds to each power supply device; a detecting means for detecting optical outputs of the plurality of laser light beams outputted from each semiconductor laser; and a determination means that determines whether the semiconductor laser is a non-defective product or a defective product while corresponding to each synchronous-pulse-signal supply part and the detecting means. COPYRIGHT: (C)2010,JPO&INPIT
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