发明名称 THREE-DIMENSIONAL MEASUREMENT APPARATUS AND METHOD THEREOF
摘要 <p>A three-dimensional measurement apparatus is provided with a plurality of cameras, a feature acquiring means which acquires from each of captured images a normal direction which is the physical feature of the surface of an object to be measured, a corresponding pixel searching means which searches pixels corresponding between the images by means of the physical feature, and a measuring means which three-dimensionally measures the object on the basis of a disparity between the corresponding pixels.  It is preferred to have a coordinate transformation means which transforms the normal direction of each image to a common coordinate system.  A parameter for the coordinate transformation can be calculated from a parameter obtained in camera calibration.  The three-dimensional measurement apparatus is capable of precisely measuring the three-dimensional shape of a mirror surface object without being influenced by the differences of the positions and characteristics of the cameras.</p>
申请公布号 WO2010032792(A1) 申请公布日期 2010.03.25
申请号 WO2009JP66272 申请日期 2009.09.17
申请人 OMRON CORPORATION;ONISHI YASUHIRO;SUWA MASAKI;SHO TO 发明人 ONISHI YASUHIRO;SUWA MASAKI;SHO TO
分类号 G01B11/245 主分类号 G01B11/245
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