发明名称 TEST CIRCUIT AND TEST METHOD
摘要 PROBLEM TO BE SOLVED: To reduce a cost required for checking a duty ratio of a clock signal. SOLUTION: A sampling time generating circuit 101 inputs a clock signal to be measured MCK, and outputs first and second sampling trigger signals to a sample-hold circuit 102 at predetermined timing before and after a time point when a half period of the clock signal to be measured MCK is elapsed from a first edge of the clock signal to be measured MCK. The sample-hold circuit 102 samples and holds the clock signal to be measured MCK in response to the first and second sampling trigger signals. The sample-hold circuit 102 configures a portion or all of scan paths, and outputs a signal held so as to verify the duty ratio from a scan output SCANOUT by a scan clock signal SCANCK. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010066019(A) 申请公布日期 2010.03.25
申请号 JP20080229964 申请日期 2008.09.08
申请人 NEC ELECTRONICS CORP 发明人 SUMI NORIKAZU
分类号 G01R31/28;G01R29/02;H01L21/82;H01L21/822;H01L27/04 主分类号 G01R31/28
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