发明名称 INTEGRATED CIRCUIT SEMICONDUCTOR DEVICE HAVING DIFFERENT GATE STACKS BETWEEN CELL REGION AND CORE/PERIPHERAL REGION AND FABRICATION METHOD THEREOF
摘要 <p>PURPOSE: An integrated circuit semiconductor device and a manufacturing method thereof are provided to prevent the deterioration of a MOS transistor on a cell region by differently forming a gate insulation layer and a gate electrode according to the cell region and a core/peri region. CONSTITUTION: An integrated circuit semiconductor device includes a semiconductor substrate(10), a first gate stack(35), and a second gate stack(42). The semiconductor substrate is divided into a cell region and a core/peri region. The gate stack includes a first gate insulation layer(16) and a first gate electrode(34). The first gate insulation layer is comprised of a silicon oxidation layer. The first gate electrode is comprised of a poly silicon layer. The poly silicon layer is doped with impurity. The second gate stack includes a second gate dielectric layer(37) and a second gate electrode(41). The second gate insulation layer includes a high-K dielectric layer. The second gate electrode includes a metal layer.</p>
申请公布号 KR20100031854(A) 申请公布日期 2010.03.25
申请号 KR20080090685 申请日期 2008.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, YOUNG JIN;SEO, KANG ILL
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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