发明名称 INFORMATION PROCESSING APPARATUS, ALLOWABLE VOLTAGE TESTING SYSTEM, AND ALLOWABLE VOLTAGE TESTING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an information processing apparatus that does not malfunction due to a sudden change in voltage during a voltage tolerance test. <P>SOLUTION: The information processing apparatus includes: a test program 2 which obtains a first voltage value as a voltage value at which a target device operates and allows the target device to operate at the first voltage value to determine whether the target device is operating in normal, warning, or abnormal state; and a voltage fluctuation control unit 12 which, if the test program 2 determines the warning or abnormal state, changes either a voltage value difference, i.e., a difference between a voltage value at which the target device operates in the next stage and the first voltage value, or a time difference, i.e., the time from the present time until the target device operates at the voltage value for the next stage, so that the change ratio obtained by dividing the voltage value difference by the time difference becomes smaller and which, if the time obtained by adding the current time to the time difference is reached, outputs a second voltage value obtained by adding or subtracting the voltage value difference to/from the first voltage value, to the test program 2 as the first voltage value. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010066945(A) 申请公布日期 2010.03.25
申请号 JP20080231801 申请日期 2008.09.10
申请人 FUJITSU LTD 发明人 NISHIYAMA KIMIHIRO
分类号 G06F11/22 主分类号 G06F11/22
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