| 摘要 |
PROBLEM TO BE SOLVED: To disperse damage to respective CPUs in a semiconductor integrated circuit having a plurality of the CPUs with higher precision than before. SOLUTION: A damage control unit 100 includes: a switching determination unit 110 functioning to determine a CPU configuration which performs the smoothing of the damage ratio according to the damage ratio of all or some of CPUs; and a switching unit 120 functioning to perform the switching of input/output signals of all the CPUs. The switching determination unit 110 observes a damage ratio calculated from values such as a temperature, a voltage, current consumption, an operation ratio, the number of times of access to resources in the CPU, at all times or at some extent of time intervals and notifies the switching unit 120 of the CPU configuration to be changed by using the calculation method for smoothing the damage ratio of each CPU. The switching unit 120 makes connection to the input/output signals of all the CPUs and a system bus 60 and switches the input/output signal of the CPU to be switched according to the notification from the switching determination unit 120. COPYRIGHT: (C)2010,JPO&INPIT |
