发明名称 METHOD FOR CORRECTING PATTERN AND PROGRAM FOR CORRECTING PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To reduce an error in a pattern correction value even when a length of a portion where patterns overlap is changed. <P>SOLUTION: A processor 1 sets a pattern as a correction object from a pattern data D1, obtains an overlapped length between a line segment on the correction object pattern and a side of a pattern adjoining to the line segment, extracts a bias corresponding to the interval between the line segment on the correction object pattern and the adjoining pattern by referring to a correction table D2, and calculates a correction value for the line segment by correcting the bias on the basis of the overlapped length between the line segment on the correction object pattern and the adjoining pattern. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010066460(A) 申请公布日期 2010.03.25
申请号 JP20080232064 申请日期 2008.09.10
申请人 TOSHIBA CORP 发明人 MAEDA YUKITO
分类号 G03F1/68;G03F1/70;H01L21/027 主分类号 G03F1/68
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