发明名称 METHOD OF INSPECTING MOUNT STATE OF COMPONENT
摘要 A mount state of components is inspected in a mounting apparatus 1b at total two divisions of a component mounting division b where the mounting apparatus 1b performs mounting and a component mounting division a where a mounting apparatus 1a disposed on an upstream side performs the mounting; the mount state of components is inspected in a mounting apparatus 1c at total three divisions of a component mounting division c where the mounting apparatus 1c performs the mounting and the component mounting divisions a and b where the mounting apparatus 1a and 1b disposed on the upstream side perform the mounting; and the mount state of components is inspected in a mounting apparatus 1d at total four divisions of a component mounting division d where the mounting apparatus 1d performs the mounting and the component mounting divisions a, b, and c where the mounting apparatus 1a, 1b, and 1c disposed on the upstream side perform the mounting. In this way, since a step in which abnormal mounting occurs can be easily specified and an effective solution can be established at a predetermined location or item, the abnormality can be easily solved.
申请公布号 KR20100031666(A) 申请公布日期 2010.03.24
申请号 KR20097024355 申请日期 2008.07.18
申请人 PANASONIC CORPORATION 发明人 KAIDA KENICHI;HIGASHI NOBORU
分类号 H05K13/08;H05K3/30;H05K13/04 主分类号 H05K13/08
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