发明名称 Reduction in thickness of semiconductor component on substrate
摘要 It is an object to reduce a thickness of a semiconductor component (chip) on a substrate to a predetermined thickness regardless of a variation in thickness of a substrate in a semiconductor product. In a semiconductor product mounted on a base plate, a surface of a semiconductor component on a substrate is set to be located at a predetermined height h from a surface of a base plate. Thereafter, through machining the surface of the semiconductor component which is adjusted to be located at the predetermined height, it is possible to make the thickness of the semiconductor component on the substrate equal to a predetermined thickness.
申请公布号 US7682936(B2) 申请公布日期 2010.03.23
申请号 US20070856769 申请日期 2007.09.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 NISHIO TOSHIHIKO;ORII YASUMITSU;OYAMA YUKIFUMI
分类号 H01L21/30 主分类号 H01L21/30
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