发明名称 Ion trap mass spectrometer
摘要 The number of times of repetition of mass spectrometry analysis for integrating mass profiles is reduced to facilitate reduction in measurement time-period and increase a signal intensity. In a state when ions are trapped by a high-frequency electric field formed within an ion trap, a rectangular-wave high-frequency voltage to be applied from a main voltage generation section to a ring electrode is temporarily stopped, and next ions are introduced from an ion entrance port into the ion trap in a state when only a static electric field exists within the ion trap. The high-frequency voltage application is re-started while at least a part of previously-trapped ions remain within the ion trap, to trap the newly-introduced ions in addition to the previous ions so as to increase an amount of ions to be accumulated, and the accumulated ions are subjected to the mass spectrometry analysis.
申请公布号 US7683316(B2) 申请公布日期 2010.03.23
申请号 US20080117311 申请日期 2008.05.08
申请人 SHIMADZU CORPORATION 发明人 TAKESHITA KENGO;OGAWA KIYOSHI
分类号 H01J49/42 主分类号 H01J49/42
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