发明名称 |
Testing pattern sensitive algorithms for semiconductor design |
摘要 |
A computer program product for generating test patterns for a pattern sensitive algorithm. The program product includes code for extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.
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申请公布号 |
US7685544(B2) |
申请公布日期 |
2010.03.23 |
申请号 |
US20070947254 |
申请日期 |
2007.11.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DEMARIS DAVID L.;DUNHAM TIMOTHY G.;LEIPOLD WILLIAM C.;MAYNARD DANIEL N.;SCAMAN MICHAEL E.;ZHONG SHI |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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