发明名称 TESTING APPARATUS OF MULTI PALLET
摘要 PURPOSE: A multi palette inspection apparatus is provided to freely set the width and the height of the object to inspect, and to inspect the connection state of a multi palette at the same time. CONSTITUTION: A multi palette inspection apparatus comprises a substrate(10), a post(20), and a bottom surface reference setting stand(30). The substrate includes insertion grooves(a) on both sides of the substrate. The post includes a height reference setting stand(21) capable of moving up and down. The bottom surface reference setting stand includes a supporting stand(31) protruded on the upper side of the substrate to support the lower side of a multi palette.
申请公布号 KR20100031164(A) 申请公布日期 2010.03.22
申请号 KR20080090118 申请日期 2008.09.12
申请人 MIJJ AUTO TECH CO., LTD. 发明人 KIM, KYU KI
分类号 B65D19/06;B65D19/02;B65D19/38 主分类号 B65D19/06
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