发明名称 INSPECTION UNIT EQUIPPED WITH CONTACT PROBE FOR GROUND
摘要 PROBLEM TO BE SOLVED: To correspond to reduced diameter of a contact probe for grounds by using a coil spring of a predetermined shape for electrical connection between the contact probe for grounds and a metal block and to reduce cost of manufacturing and omission of preparation process at the time of built-in. SOLUTION: While including a conductive coil spring 30 arranged between a contact probe 1 for grounds which is arranged coaxially to a through-hole 11 of a metal block 10 and an inner circumference surface of the through-hole 11, a large diameter coil section 31 and a small diameter coil section 32 are formed eccentrically each other in the coil spring 30. Because, while the large diameter coil section 31 gets in touch elastically with the inner circumference surface of the through-hole 11, the small diameter coil section 32 gets in touch elastically with the outer circumference surface of the contact probe 1 for grounds, the contact probe 1 for grounds and the metal block 10 are connected electrically. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010060527(A) 申请公布日期 2010.03.18
申请号 JP20080229119 申请日期 2008.09.05
申请人 YOKOWO CO LTD 发明人 TODOROKI TAKESHI
分类号 G01R1/067;G01R31/26 主分类号 G01R1/067
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