发明名称 Method and equipment for measuring feature points of wave signal
摘要 A measuring method and equipment for detecting quickly and with high precision feature points (peak points or trough points) of a waveform even with waveform signals with irregular feature point values or irregular distances between feature points as in the density waveform signals or the like obtained from tree ring images or the like of wood specimens. In the measuring method and equipment, wavelet conversion of the waveform signal within a predetermined interval is performed by using a predetermined mother wavelet and multiple scale levels, squared mean for interval for each interval width corresponding to said scale levels is calculated in relation to a wavelet conversion signal for each scale level generated by the said wavelet conversion, a scale level at a point where the calculated value of the said squared mean for interval becomes maximum at an arbitrary point within the predetermined interval is decided as a dominant level for that point, and points at which the said waveform signal reaches maximum value or minimum value for each interval width corresponding to the dominant level are detected as the feature points of the waveform signal.
申请公布号 US2010067804(A1) 申请公布日期 2010.03.18
申请号 US20090380358 申请日期 2009.02.26
申请人 OKOCHI TAKAYUKI 发明人 OKOCHI TAKAYUKI
分类号 A01G7/00;G06K9/46;G01B11/00;G01N23/04;G06F17/14;G06K9/00;G06T7/40;G06T7/60 主分类号 A01G7/00
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