发明名称 CANTILEVER TYPE MICRO CONTACT PROBE WITH HINGE STRUCTURE
摘要 According to the present invention, allowable displacement can be increased from an excellent stress relaxation effect achieved by applying a hinge structure while adopting advantages of a dual beam cantilever-type probe that can reduce scrub. Since the hinge structure is a structure that does not receive a moment, an effect that is the same as eliminating a moment in a conventional prove can be achieved so that stress can be evenly applied and the allowable displacement of the probe can be increased.
申请公布号 KR100947862(B1) 申请公布日期 2010.03.18
申请号 KR20080062492 申请日期 2008.06.30
申请人 发明人
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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