发明名称 SOLID-STATE IMAGING APPARATUS, AND INSPECTION METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus evaluating an influence on noise included in a signal to be output from an output circuit. Ž<P>SOLUTION: The output circuit 3 has an FD (Floating Diffusion) amplifier 30, in which an output transistor T1, output transistors T2, T3 are cascaded, the solid-state imaging apparatus 1 is provided with a reset transistor 2 which provides potential to a gate T1<SB>G</SB>of the output transistor T1, a node 7 is connected to the gate T1<SB>G</SB>of the output transistor, first potential can be provided to a node 6 from an external power source 31, and second potential can be provided to a drain of the output transistor T1 from an external power source 32. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010062751(A) 申请公布日期 2010.03.18
申请号 JP20080225082 申请日期 2008.09.02
申请人 SHARP CORP 发明人 SHIMADA KAZUYUKI
分类号 H01L21/339;H01L27/14;H01L29/762;H04N5/335;H04N5/341;H04N5/357;H04N5/369;H04N5/372;H04N5/3745 主分类号 H01L21/339
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