| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device making burn-in test or test by means of a tester more accurate and easier. SOLUTION: This device includes a nonvolatile memory 7 holding communication data D1. In burn-in testing or testing a USB function 5 by means of a tester, the communication data D1 held by the nonvolatile memory 7 are given to the USB function 5 via a selector 8. This enhances the operation rate of the USB function 5 in burn-in testing while this further dispenses with setting a long protocol for the tester in testing the USB function 5 by means of a tester. COPYRIGHT: (C)2010,JPO&INPIT
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