发明名称 METHOD FOR PRODUCING BONDED SILICON WAFER
摘要 A bonded silicon wafer is produced by a method comprising an oxygen ion implantation step on a silicon wafer for active layer having the specified wafer face; a step of bonding the silicon wafer for active layer to a silicon wafer for support; a first heat treatment step; an inner SiO2 layer exposing step; a step of removing the inner SiO2 layer; and a planarizing step of polishing a silicon wafer composite or subjecting the silicon wafer composite to a heat treatment in a reducing atmosphere (a second heat treatment step).
申请公布号 US2010068867(A1) 申请公布日期 2010.03.18
申请号 US20090557809 申请日期 2009.09.11
申请人 SUMCO CORPORATION 发明人 KUSABA TATSUMI;ENDO AKIHIKO;NISHIHATA HIDEKI;MORIMOTO NOBUYUKI
分类号 H01L21/762 主分类号 H01L21/762
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