发明名称 MOUNTING STRUCTURE, ELECTROOPTICAL DEVICE, AND ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a mounting structure capable of detecting connection resistance between terminals between a substrate and a mounting component at an arbitrary timing and further, automatically correcting operation conditions, according to the change of the connection resistance between the terminals and to provide an electrooptical device and an electronic apparatus. Ž<P>SOLUTION: In the mounting structure 1, two first inspection terminals 301a and 301b in a short-circuited state are formed in a semiconductor IC3 and two second inspection terminals 201a and 201b connected to the first inspection terminals 301a and 301b respectively are formed in the substrate 2. Therefore, when a terminal-to-terminal resistance detection part 91 detects the connection resistance R23 of the second inspection terminals 201a and 201b, the detection result corresponds to the connection resistance between the first inspection terminals 301a and 301b and the second inspection terminals 201a and 201b, so that the connection resistance between a substrate-side input/output terminal 201s and a mounting-component-side input/output terminal 301s connected to each other similarly can be monitored. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010060865(A) 申请公布日期 2010.03.18
申请号 JP20080226728 申请日期 2008.09.04
申请人 EPSON IMAGING DEVICES CORP 发明人 SHIMIZU KEI;KOBAYASHI SHINICHI
分类号 G09F9/00;G02F1/133;G09F9/30;H01L51/50 主分类号 G09F9/00
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