发明名称 CUTTING PROCESSING APPARATUS AND CUTTING PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a cutting processing apparatus and a cutting processing method which can facilitate separation without damaging a device formed on a wafer surface, and can efficiently remove contamination remaining in a gap between a wafer and a protection member. SOLUTION: The work W is cut while a fluid 21 is supplied by a fluid supply means 11 from a processing groove 20 to the gap 19 between the protection member 16 and wafer 15. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010062487(A) 申请公布日期 2010.03.18
申请号 JP20080229336 申请日期 2008.09.08
申请人 TOKYO SEIMITSU CO LTD 发明人 KAMATA SHINJI
分类号 H01L21/301 主分类号 H01L21/301
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