发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>Provided is a semiconductor device, wherein a gate insulating film (5) is formed on a first conductivity type semiconductor region (1a), a gate electrode (6) is formed on the gate insulating film (5), and on a side surface of the gate electrode (6), a first offset spacer (7a), a second offset spacer (7b) and a side wall (10) are sequentially formed.  Furthermore, a second conductivity type extension region (8) is formed below a side of the gate electrode (6) in the semiconductor region (1a), and a first conductivity type pocket region (9) is formed below the side of the gate electrode (6) below the extension region (8) in the semiconductor region (1a).</p>
申请公布号 WO2010029681(A1) 申请公布日期 2010.03.18
申请号 WO2009JP03473 申请日期 2009.07.23
申请人 PANASONIC CORPORATION;YAMASHITA, KYOUJI;IKOMA, DAISAKU;KAMEI, MASAYUKI 发明人 YAMASHITA, KYOUJI;IKOMA, DAISAKU;KAMEI, MASAYUKI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
主权项
地址