发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve the property and the reliability of the semiconductor device including the separation of landing plugs by minimizing the step height of gates. CONSTITUTION: Landing plugs are formed in the first region of a cell region. Landing plugs are not formed in the second region of the cell region. Gates(102) are formed in the cell region and a peripheral area. An insulation layer(106) is formed on a semiconductor layer to cover the gates. The insulation is etched to expose the gates and the semiconductor substrates. A conductive layer is formed to bury the exposed part. A first etch back is performed to expose a hard mask(104) which is arranged in the second region. A second etch back is performed to reduce the step difference between the hard masks which are arranged on the first and the second regions.
申请公布号 KR20100030488(A) 申请公布日期 2010.03.18
申请号 KR20080089460 申请日期 2008.09.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SUNG EUN;CHAE, KWANG KEE;KIM, HYUNG HWAN;JUNG, JONG GOO;MOON, OK MIN;LEE, YOUNG BANG
分类号 H01L21/336;H01L21/8242 主分类号 H01L21/336
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