发明名称 OXIDE THIN-FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide an oxide thin-film transistor having stable characteristics, and to provide a method of manufacturing the same. Ž<P>SOLUTION: A gate insulating layer 5 laminated on an upper surface of an oxide semiconductor layer 9 is constituted of a non-fluoro organic resin layer 51 covering the oxide semiconductor layer 9 and an amorphous perfluoro resin layer 52 covering the non-fluoro organic resin layer 51. It has been confirmed that the oxide thin-film transistor 1 having the stable characteristics can be obtained by using the amorphous perfluoro resin layer 52 as a constituent element of the gate insulating layer 5. It has been confirmed that the oxide thin-film transistor 1 having a low drive voltage can be obtained by adopting PVP (polyvinyl phenol) higher in permittivity than the amorphous perfluoro resin as the material of the non-fluoro organic resin layer 51. Thus, the high performance oxide thin-film transistor 1 can be readily obtained at a low cost. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010062276(A) 申请公布日期 2010.03.18
申请号 JP20080225510 申请日期 2008.09.03
申请人 BROTHER IND LTD 发明人 IIJIMA RYUTA;MIURA NORIKO;ITAGAKI GENJI
分类号 H01L29/786;H01L21/28;H01L21/283;H01L21/336 主分类号 H01L29/786
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