发明名称 X-RAY METERING APPARATUS, AND X-RAY METERING METHOD
摘要 <p>An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).</p>
申请公布号 EP2164308(A1) 申请公布日期 2010.03.17
申请号 EP20080790769 申请日期 2008.07.01
申请人 IHI CORPORATION;THE UNIVERSITY OF TOKYO 发明人 NOSE, HIROYUKI;ISHIDA, DAISUKE;KANEKO, NAMIO;SAKAI, YASUO;UESAKA, MITSURU;SAKAMOTO, FUMITO;DOBASHI, KATSUHIRO
分类号 H05G2/00 主分类号 H05G2/00
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