发明名称 SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION
摘要 <p>An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.</p>
申请公布号 EP2162732(A1) 申请公布日期 2010.03.17
申请号 EP20080743876 申请日期 2008.03.14
申请人 X-RAY OPTICAL SYSTEMS, INC. 发明人 CHEN, ZEWU;DANHONG, LI
分类号 G01N23/223 主分类号 G01N23/223
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