| 摘要 |
A measurement apparatus includes a measurement unit (1-5, 8) configured to irradiate three types of ultrasonic waves and light upon a test region (6) in a test object (7), and to measure modulated light and non-modulated light, the modulated light being modulated by an acousto-optical effect, and a signal processor (9) configured to calculate a modulation depth that is an intensity of the modulated light divided by an intensity of the non-modulated light for the one, and at least one of a scattering characteristic and an absorption characteristic of the test region in the test object by utilizing a first change rate of the modulation depth to an amplitude of the one or an amount corresponding to the first change rate, and a second change rate of the modulation depth to a frequency of the one or an amount corresponding to the second change rate. |
