发明名称
摘要 <p>A method of forming a silicon-based thin film according to the present invention comprises introducing a source gas containing silicon fluoride and hydrogen into a vacuum vessel, and using a high frequency plasma CVD method to form a silicon-based thin film on a substrate introduced into the vacuum vessel, wherein a luminous intensity attributed to SiFalpha (440 nm) is not smaller than a luminous intensity attributed to Halpha (656 nm), thereby providing a photovoltaic element with excellent performance at a low cost as compared with a conventional one, a method of forming a silicon-based thin film with excellent characteristics in a short process cycle time at a further increased film-forming rate, a silicon-based thin film formed by the method, and a photovoltaic element comprising the silicon-based thin film with excellent characteristics, adhesion, and resistance to the environments.</p>
申请公布号 JP4433131(B2) 申请公布日期 2010.03.17
申请号 JP20020075267 申请日期 2002.03.18
申请人 发明人
分类号 H01L31/04;C30B1/00;C30B25/10;C30B29/06;H01L21/20;H01L21/205;H01L21/36;H01L31/075;H01L31/20 主分类号 H01L31/04
代理机构 代理人
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