发明名称 SEMICONDUCTOR TRENCH STRUCTURE HAVING A SEALING PLUG AND METHOD
摘要 PURPOSE: A semiconductor trench structure and a method thereof are provided to reduce influence of parasitic devices adjacent to a trench by providing a stress hermetic sealing configuration reducing the inclusion of contaminants in the core region of the trench. CONSTITUTION: A semiconductor trench structure and a method thereof comprise a semiconductor material(110), a trench(422), and a dielectric layer(128). The semiconductor material includes a buried layer between a substrate(121) and a semiconductor layer(124). The trench is expanded from the major surface to the inside the semiconductor material, and includes an upper sidewall surfaces, a bottom-sidewall surfaces, and a bottom surface. The dielectric layer covers the bottom-sidewall surfaces and the bottom surface of the trench.
申请公布号 KR20100029701(A) 申请公布日期 2010.03.17
申请号 KR20090081345 申请日期 2009.08.31
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. 发明人 GRIVNA GORDON M.;LOECHELT GARY H.;PARSEY JR. JOHN MICHAEL;QUDDUS MOHAMMED TANVIR
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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