发明名称 Method of fabricating a recess gate type transistor
摘要 A semiconductor device having recess gates and a method for fabricating the same. The semiconductor device includes a semiconductor substrate having inverse triangular recesses formed therein; a gate insulating film having a designated thickness formed on the semiconductor substrate; gate electrodes formed on the gate insulating film so that the gate electrodes fill the inverse triangular recesses and protrude from the surface of the semiconductor substrate; and first and second junction regions formed in the semiconductor substrate and opposed to each other so that the corresponding one of the gate electrodes is interposed therebetween.
申请公布号 US7678653(B2) 申请公布日期 2010.03.16
申请号 US20090371798 申请日期 2009.02.16
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROUH KYOUNG BONG;JIN SEUNG WOO;LEE MIN YONG;JUNG YONG SOO
分类号 H01L21/336 主分类号 H01L21/336
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