发明名称 Semiconductor device and fabrication process thereof
摘要 There is provided a semiconductor device having a device isolation region of STI structure formed on a silicon substrate so as to define a device region, wherein the device isolation region comprises a device isolation trench formed in the silicon substrate, and a device isolation insulation film filling the device isolation trench. At least a surface part of the device isolation insulation film is formed of an HF-resistant film.
申请公布号 US7678641(B2) 申请公布日期 2010.03.16
申请号 US20050211103 申请日期 2005.08.25
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 MORI TOSHIFUMI;OOKOSHI KATSUAKI;WATANABE TAKASHI;OHTA HIROYUKI
分类号 H01L29/00 主分类号 H01L29/00
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